Sergey G. Mosin. Automated simulation of faults in analog circuits based on parallel paradigm. In 2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017. pages 1-6, IEEE Computer Society, 2017. [doi]
@inproceedings{Mosin17, title = {Automated simulation of faults in analog circuits based on parallel paradigm}, author = {Sergey G. Mosin}, year = {2017}, doi = {10.1109/EWDTS.2017.8110133}, url = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2017.8110133}, researchr = {https://researchr.org/publication/Mosin17}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017}, publisher = {IEEE Computer Society}, isbn = {978-1-5386-3299-4}, }