A Bist PLA Design for High Fault Coverage and Testing by an Interleavingly Crosspoint Counting

Md. Abdul Mottalib, P. Dasgupta. A Bist PLA Design for High Fault Coverage and Testing by an Interleavingly Crosspoint Counting. In VLSI Design. pages 117-122, 1994.

@inproceedings{MottalibD94,
  title = {A Bist PLA Design for High Fault Coverage and Testing by an Interleavingly Crosspoint Counting},
  author = {Md. Abdul Mottalib and P. Dasgupta},
  year = {1994},
  tags = {test coverage, testing, design, coverage},
  researchr = {https://researchr.org/publication/MottalibD94},
  cites = {0},
  citedby = {0},
  pages = {117-122},
  booktitle = {VLSI Design},
}