Locally optimal detection of adversarial inputs to image classifiers

Pierre Moulin, Amish Goel. Locally optimal detection of adversarial inputs to image classifiers. In 2017 IEEE International Conference on Multimedia & Expo Workshops, ICME Workshops, Hong Kong, China, July 10-14, 2017. pages 459-464, IEEE Computer Society, 2017. [doi]

@inproceedings{MoulinG17,
  title = {Locally optimal detection of adversarial inputs to image classifiers},
  author = {Pierre Moulin and Amish Goel},
  year = {2017},
  doi = {10.1109/ICMEW.2017.8026257},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICMEW.2017.8026257},
  researchr = {https://researchr.org/publication/MoulinG17},
  cites = {0},
  citedby = {0},
  pages = {459-464},
  booktitle = {2017 IEEE International Conference on Multimedia & Expo Workshops, ICME Workshops, Hong Kong, China, July 10-14, 2017},
  publisher = {IEEE Computer Society},
  isbn = {978-1-5386-0560-8},
}