Ireneusz Mrozek, Vyacheslav N. Yarmolik. Two-Run RAM March Testing with Address Decimation. Journal of Circuits, Systems, and Computers, 26(2):1-17, 2017. [doi]
@article{MrozekY17,
title = {Two-Run RAM March Testing with Address Decimation},
author = {Ireneusz Mrozek and Vyacheslav N. Yarmolik},
year = {2017},
doi = {10.1142/S0218126617500311},
url = {http://dx.doi.org/10.1142/S0218126617500311},
researchr = {https://researchr.org/publication/MrozekY17},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {26},
number = {2},
pages = {1-17},
}