Local Discriminative Distance Metrics and their Real World Applications

Yang Mu, Wei Ding 0003. Local Discriminative Distance Metrics and their Real World Applications. In Wei Ding 0003, Takashi Washio, Hui Xiong, George Karypis, Bhavani M. Thuraisingham, Diane J. Cook, Xindong Wu, editors, 13th IEEE International Conference on Data Mining Workshops, ICDM Workshops, TX, USA, December 7-10, 2013. pages 1145-1152, IEEE Computer Society, 2013. [doi]

@inproceedings{Mu013,
  title = {Local Discriminative Distance Metrics and their Real World Applications},
  author = {Yang Mu and Wei Ding 0003},
  year = {2013},
  doi = {10.1109/ICDMW.2013.44},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICDMW.2013.44},
  researchr = {https://researchr.org/publication/Mu013},
  cites = {0},
  citedby = {0},
  pages = {1145-1152},
  booktitle = {13th IEEE International Conference on Data Mining Workshops, ICDM Workshops, TX, USA, December 7-10, 2013},
  editor = {Wei Ding 0003 and Takashi Washio and Hui Xiong and George Karypis and Bhavani M. Thuraisingham and Diane J. Cook and Xindong Wu},
  publisher = {IEEE Computer Society},
}