Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar 0002. Printed Machine Learning Classifiers. In 53rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2020, Athens, Greece, October 17-21, 2020. pages 73-87, IEEE, 2020. [doi]
@inproceedings{MubarikWBTATK20,
title = {Printed Machine Learning Classifiers},
author = {Muhammad Husnain Mubarik and Dennis D. Weller and Nathaniel Bleier and Matthew Tomei and Jasmin Aghassi-Hagmann and Mehdi B. Tahoori and Rakesh Kumar 0002},
year = {2020},
doi = {10.1109/MICRO50266.2020.00019},
url = {https://doi.org/10.1109/MICRO50266.2020.00019},
researchr = {https://researchr.org/publication/MubarikWBTATK20},
cites = {0},
citedby = {0},
pages = {73-87},
booktitle = {53rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2020, Athens, Greece, October 17-21, 2020},
publisher = {IEEE},
isbn = {978-1-7281-7383-2},
}