A New Method for Testing EEPLA s - researchr publication authors

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Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi. A New Method for Testing EEPLA s. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 146-154, IEEE Computer Society, 1998. [doi]

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