Fork-Coupled Resonators for High-Frequency Characterization of Dielectric Substrate Materials

Ali Hussein Muqaibel, Ahmad Safaai-Jazi, Sedki M. Riad. Fork-Coupled Resonators for High-Frequency Characterization of Dielectric Substrate Materials. IEEE T. Instrumentation and Measurement, 55(6):2216-2220, 2006. [doi]

@article{MuqaibelSR06,
  title = {Fork-Coupled Resonators for High-Frequency Characterization of Dielectric Substrate Materials},
  author = {Ali Hussein Muqaibel and Ahmad Safaai-Jazi and Sedki M. Riad},
  year = {2006},
  doi = {10.1109/TIM.2006.884390},
  url = {http://dx.doi.org/10.1109/TIM.2006.884390},
  researchr = {https://researchr.org/publication/MuqaibelSR06},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {55},
  number = {6},
  pages = {2216-2220},
}