Masayuki Murakami, Nakaji Honda. Experimental Investigation of the Fault Tolerance of IDS Models. In FUZZ-IEEE 2007, IEEE International Conference on Fuzzy Systems, Imperial College, London, UK, 23-26 July, 2007, Proceedings. pages 1-7, IEEE, 2007. [doi]
@inproceedings{MurakamiH07:1, title = {Experimental Investigation of the Fault Tolerance of IDS Models}, author = {Masayuki Murakami and Nakaji Honda}, year = {2007}, doi = {10.1109/FUZZY.2007.4295667}, url = {http://dx.doi.org/10.1109/FUZZY.2007.4295667}, researchr = {https://researchr.org/publication/MurakamiH07%3A1}, cites = {0}, citedby = {0}, pages = {1-7}, booktitle = {FUZZ-IEEE 2007, IEEE International Conference on Fuzzy Systems, Imperial College, London, UK, 23-26 July, 2007, Proceedings}, publisher = {IEEE}, }