Hide Murayama, Makoto Yamazaki, Shigeru Nakajima. Electromigration and electrochemical reaction mixed failure mechanism in gold interconnection system. Microelectronics Reliability, 41(8):1265-1272, 2001. [doi]
@article{MurayamaYN01,
title = {Electromigration and electrochemical reaction mixed failure mechanism in gold interconnection system},
author = {Hide Murayama and Makoto Yamazaki and Shigeru Nakajima},
year = {2001},
doi = {10.1016/S0026-2714(01)00112-3},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00112-3},
researchr = {https://researchr.org/publication/MurayamaYN01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {8},
pages = {1265-1272},
}