G. El-Murr, A. Griffo, J. Wang, Z. Q. Zhu, B. Mecrow. Reliability assessment of fault tolerant permanent magnet AC drives. In IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society, Yokohama, Japan, November 9-12, 2015. pages 2777-2782, IEEE, 2015. [doi]
@inproceedings{MurrGWZM15,
title = {Reliability assessment of fault tolerant permanent magnet AC drives},
author = {G. El-Murr and A. Griffo and J. Wang and Z. Q. Zhu and B. Mecrow},
year = {2015},
doi = {10.1109/IECON.2015.7392522},
url = {https://doi.org/10.1109/IECON.2015.7392522},
researchr = {https://researchr.org/publication/MurrGWZM15},
cites = {0},
citedby = {0},
pages = {2777-2782},
booktitle = {IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society, Yokohama, Japan, November 9-12, 2015},
publisher = {IEEE},
isbn = {978-1-4799-1762-4},
}