Evaluation of IDS model by improving accuracy and reducing overfitting using stacking LSTM - researchr publication bibliographies

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Muhammad Bisri Musthafa, Samsul Huda, Ali Md. Arshad, Yuta Kodera, Yasuyuki Nogami. Evaluation of IDS model by improving accuracy and reducing overfitting using stacking LSTM. In IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024. pages 1-5, IEEE, 2024. [doi]

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