Peter Muth. A Nine-Valued Circuit Model for Test Generation. IEEE Transactions on Computers, 25(6):630-636, 1976.
@article{Muth76,
title = {A Nine-Valued Circuit Model for Test Generation},
author = {Peter Muth},
year = {1976},
tags = {testing},
researchr = {https://researchr.org/publication/Muth76},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {25},
number = {6},
pages = {630-636},
}