Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell - researchr publication authors

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Bharathi Raj Muthu, Ewins Pon Pushpa, Vaithiyanathan Dhandapani, Kamala Jayaraman, Hemalatha Vasanthakumar, Won-Chun Oh, Suresh Sagadevan. Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell. Sensors, 22(1):33, 2022. [doi]

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