Sreenivaas S. Muthyala, Nur A. Touba. Improving test compression with scan feedforward techniques. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]
@inproceedings{MuthyalaT14-0,
title = {Improving test compression with scan feedforward techniques},
author = {Sreenivaas S. Muthyala and Nur A. Touba},
year = {2014},
doi = {10.1109/TEST.2014.7035358},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035358},
researchr = {https://researchr.org/publication/MuthyalaT14-0},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}