Marc Mydill. A Test-System Architecture to Reduce Transmission Line Effects During High-Speed Testing. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 701-709, IEEE Computer Society, 1994.
@inproceedings{Mydill94,
title = {A Test-System Architecture to Reduce Transmission Line Effects During High-Speed Testing},
author = {Marc Mydill},
year = {1994},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/Mydill94},
cites = {0},
citedby = {0},
pages = {701-709},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}