Understanding Measurement Perturbation in Trace-based Data

Todd Mytkowicz, Amer Diwan, Matthias Hauswirth, Peter F. Sweeney. Understanding Measurement Perturbation in Trace-based Data. In 21th International Parallel and Distributed Processing Symposium (IPDPS 2007), Proceedings, 26-30 March 2007, Long Beach, California, USA. pages 1-6, IEEE, 2007. [doi]

Authors

Todd Mytkowicz

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Amer Diwan

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Matthias Hauswirth

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Peter F. Sweeney

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