Taehui Na, Jung Pill Kim, Seung-Hyuk Kang, Seong-Ook Jung. Read Disturbance Reduction Technique for Offset-Canceling Dual-Stage Sensing Circuits in Deep Submicrometer STT-RAM. IEEE Trans. on Circuits and Systems, 63-II(6):578-582, 2016. [doi]
@article{NaKKJ16,
title = {Read Disturbance Reduction Technique for Offset-Canceling Dual-Stage Sensing Circuits in Deep Submicrometer STT-RAM},
author = {Taehui Na and Jung Pill Kim and Seung-Hyuk Kang and Seong-Ook Jung},
year = {2016},
doi = {10.1109/TCSII.2016.2530883},
url = {http://dx.doi.org/10.1109/TCSII.2016.2530883},
researchr = {https://researchr.org/publication/NaKKJ16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {63-II},
number = {6},
pages = {578-582},
}