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Data-Cell-Variation-Tolerant Dual-Mode Sensing Scheme for Deep Submicrometer STT-RAM

Taehui Na, Byungkyu Song, Jung Pill Kim, Seung-Hyuk Kang, Seong-Ook Jung. Data-Cell-Variation-Tolerant Dual-Mode Sensing Scheme for Deep Submicrometer STT-RAM. IEEE Trans. on Circuits and Systems, 65-I(1):163-174, 2018. [doi]

Authors

Taehui Na

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Byungkyu Song

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Jung Pill Kim

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Seung-Hyuk Kang

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Seong-Ook Jung

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