Similarity assessment with local binary patterns

Vasif V. Nabiyev, Beste Gencturk. Similarity assessment with local binary patterns. In 20th Signal Processing and Communications Applications Conference, SIU 2012, Mugla, Turkey, April 18-20, 2012. pages 1-4, IEEE, 2012. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.