Subhrajit Nag, Dhruv Makwana, R. Sai Chandra Teja, Sparsh Mittal, C. Krishna Mohan. WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects. Computers in Industry, 142:103720, 2022. [doi]
@article{NagMTMM22,
title = {WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects},
author = {Subhrajit Nag and Dhruv Makwana and R. Sai Chandra Teja and Sparsh Mittal and C. Krishna Mohan},
year = {2022},
doi = {10.1016/j.compind.2022.103720},
url = {https://doi.org/10.1016/j.compind.2022.103720},
researchr = {https://researchr.org/publication/NagMTMM22},
cites = {0},
citedby = {0},
journal = {Computers in Industry},
volume = {142},
pages = {103720},
}