Tadashi Nagano, Yoshifumi Sakamoto, Satoshi Haraguchi, Hironori Takeuchi, Shiho Ogino, Akira Fukuda. Critiquing Rules and Quality Quantification of Development-Related Documents. In Koichi Matsuda, Ken-ichi Matsumoto, Akito Monden, editors, 2011 Joint Conf of 21st Int'l Workshop on Software Measurement and the 6th Int'l Conference on Software Process and Product Measurement, IWSM/Mensura 2011, Nara, Japan, November 3-4, 2011. pages 30-37, IEEE, 2011. [doi]
@inproceedings{NaganoSHTOF11,
title = {Critiquing Rules and Quality Quantification of Development-Related Documents},
author = {Tadashi Nagano and Yoshifumi Sakamoto and Satoshi Haraguchi and Hironori Takeuchi and Shiho Ogino and Akira Fukuda},
year = {2011},
doi = {10.1109/IWSM-MENSURA.2011.30},
url = {http://doi.ieeecomputersociety.org/10.1109/IWSM-MENSURA.2011.30},
researchr = {https://researchr.org/publication/NaganoSHTOF11},
cites = {0},
citedby = {0},
pages = {30-37},
booktitle = {2011 Joint Conf of 21st Int'l Workshop on Software Measurement and the 6th Int'l Conference on Software Process and Product Measurement, IWSM/Mensura 2011, Nara, Japan, November 3-4, 2011},
editor = {Koichi Matsuda and Ken-ichi Matsumoto and Akito Monden},
publisher = {IEEE},
isbn = {978-1-4577-1930-1},
}