Seungjun Nah, Sanghyun Son, Radu Timofte, Kyoung Mu Lee, Yu Tseng, Yu-Syuan Xu, Cheng-Ming Chiang, Yi-Min Tsai, Stephan Brehm, Sebastian Scherer, Dejia Xu, Yihao Chu, Qingyan Sun, Jiaqin Jiang, Lunhao Duan, Jian Yao, Kuldeep Purohit, Maitreya Suin, A. N. Rajagopalan, Yuichi Ito, Hrishikesh P. S, Densen Puthussery, Akhil K. A, Jiji C. V, Guisik Kim, Deepa P. L, Zhiwei Xiong, Jie Huang, Dong Liu, Sangmin Kim, Hyungjoon Nam, Jisu Kim, Jechang Jeong, Shihua Huang, Yuchen Fan, Jiahui Yu, Haichao Yu, Thomas S. Huang, Ya Zhou, Xin Li, Sen Liu, Zhibo Chen 0001, Saikat Dutta, Sourya Dipta Das, Shivam Garg, Daniel Sprague, Bhrij Patel, Thomas Huck. NTIRE 2020 Challenge on Image and Video Deblurring. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 1662-1675, IEEE, 2020. [doi]
@inproceedings{NahSTLTXCTBSXCS20,
title = {NTIRE 2020 Challenge on Image and Video Deblurring},
author = {Seungjun Nah and Sanghyun Son and Radu Timofte and Kyoung Mu Lee and Yu Tseng and Yu-Syuan Xu and Cheng-Ming Chiang and Yi-Min Tsai and Stephan Brehm and Sebastian Scherer and Dejia Xu and Yihao Chu and Qingyan Sun and Jiaqin Jiang and Lunhao Duan and Jian Yao and Kuldeep Purohit and Maitreya Suin and A. N. Rajagopalan and Yuichi Ito and Hrishikesh P. S and Densen Puthussery and Akhil K. A and Jiji C. V and Guisik Kim and Deepa P. L and Zhiwei Xiong and Jie Huang and Dong Liu and Sangmin Kim and Hyungjoon Nam and Jisu Kim and Jechang Jeong and Shihua Huang and Yuchen Fan and Jiahui Yu and Haichao Yu and Thomas S. Huang and Ya Zhou and Xin Li and Sen Liu and Zhibo Chen 0001 and Saikat Dutta and Sourya Dipta Das and Shivam Garg and Daniel Sprague and Bhrij Patel and Thomas Huck},
year = {2020},
doi = {10.1109/CVPRW50498.2020.00216},
url = {https://doi.org/10.1109/CVPRW50498.2020.00216},
researchr = {https://researchr.org/publication/NahSTLTXCTBSXCS20},
cites = {0},
citedby = {0},
pages = {1662-1675},
booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9360-1},
}