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Analyzing relationship between the number of errors in review processes for embedded software development projects

Toyoshiro Nakashima, Kazunori Iwata, Yoshiyuki Anan, Naohiro Ishii. Analyzing relationship between the number of errors in review processes for embedded software development projects. In Takayuki Ito, Yanggon Kim, Naoki Fukuta, editors, 14th IEEE/ACIS International Conference on Computer and Information Science, ICIS 2015, Las Vegas, NV, USA, June 28 - July 1, 2015. pages 485-490, IEEE, 2015. [doi]

Authors

Toyoshiro Nakashima

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Kazunori Iwata

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Yoshiyuki Anan

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Naohiro Ishii

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