Detailed analysis of I/O traces for large scale applications - researchr publication authors

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Nithin Nakka, Alok N. Choudhary, Wei-keng Liao, Lee Ward, Ruth Klundt, Marlow I. Weston. Detailed analysis of I/O traces for large scale applications. In Yuanyuan Yang, Manish Parashar, Rajeev Muralidhar, Viktor K. Prasanna, editors, 16th International Conference on High Performance Computing, HiPC 2009, December 16-19, 2009, Kochi, India, Proceedings. pages 419-427, IEEE, 2009. [doi]

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