Jaechang Nam, Sunghun Kim. CLAMI: Defect Prediction on Unlabeled Datasets (T). In Myra B. Cohen, Lars Grunske, Michael Whalen, editors, 30th IEEE/ACM International Conference on Automated Software Engineering, ASE 2015, Lincoln, NE, USA, November 9-13, 2015. pages 452-463, IEEE, 2015. [doi]
@inproceedings{NamK15-0,
title = {CLAMI: Defect Prediction on Unlabeled Datasets (T)},
author = {Jaechang Nam and Sunghun Kim},
year = {2015},
doi = {10.1109/ASE.2015.56},
url = {http://dx.doi.org/10.1109/ASE.2015.56},
researchr = {https://researchr.org/publication/NamK15-0},
cites = {0},
citedby = {0},
pages = {452-463},
booktitle = {30th IEEE/ACM International Conference on Automated Software Engineering, ASE 2015, Lincoln, NE, USA, November 9-13, 2015},
editor = {Myra B. Cohen and Lars Grunske and Michael Whalen},
publisher = {IEEE},
isbn = {978-1-5090-0025-8},
}