Kazuteru Namba, Hideo Ito. Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation. IEICE Transactions, 88-D(9):2135-2142, 2005. [doi]
@article{NambaI05,
title = {Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation},
author = {Kazuteru Namba and Hideo Ito},
year = {2005},
doi = {10.1093/ietisy/e88-d.9.2135},
url = {http://dx.doi.org/10.1093/ietisy/e88-d.9.2135},
tags = {testing},
researchr = {https://researchr.org/publication/NambaI05},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {88-D},
number = {9},
pages = {2135-2142},
}