Haiqing Nan, Ken Choi. Low cost and highly reliable hardened latch design for nanoscale CMOS technology. Microelectronics Reliability, 52(6):1209-1214, 2012. [doi]
@article{NanC12-0,
title = {Low cost and highly reliable hardened latch design for nanoscale CMOS technology},
author = {Haiqing Nan and Ken Choi},
year = {2012},
doi = {10.1016/j.microrel.2012.01.001},
url = {http://dx.doi.org/10.1016/j.microrel.2012.01.001},
researchr = {https://researchr.org/publication/NanC12-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {6},
pages = {1209-1214},
}