Dhruv Nandakumar, Robert Schiller, Christopher Redino, Kevin Choi, Abdul-Rahman, Edward Bowen, Marc Vucovich, Joe Nehila, Matthew Weeks, Aaron Shaha. Zero Day Threat Detection Using Metric Learning Autoencoders. In M. Arif Wani, Mehmed M. Kantardzic, Vasile Palade, Daniel Neagu, Longzhi Yang, Kit Yan Chan, editors, 21st IEEE International Conference on Machine Learning and Applications, ICMLA 2022, Nassau, Bahamas, December 12-14, 2022. pages 1318-1325, IEEE, 2022. [doi]
@inproceedings{NandakumarSRCRBVNWS22,
title = {Zero Day Threat Detection Using Metric Learning Autoencoders},
author = {Dhruv Nandakumar and Robert Schiller and Christopher Redino and Kevin Choi and Abdul-Rahman and Edward Bowen and Marc Vucovich and Joe Nehila and Matthew Weeks and Aaron Shaha},
year = {2022},
doi = {10.1109/ICMLA55696.2022.00210},
url = {https://doi.org/10.1109/ICMLA55696.2022.00210},
researchr = {https://researchr.org/publication/NandakumarSRCRBVNWS22},
cites = {0},
citedby = {0},
pages = {1318-1325},
booktitle = {21st IEEE International Conference on Machine Learning and Applications, ICMLA 2022, Nassau, Bahamas, December 12-14, 2022},
editor = {M. Arif Wani and Mehmed M. Kantardzic and Vasile Palade and Daniel Neagu and Longzhi Yang and Kit Yan Chan},
publisher = {IEEE},
isbn = {978-1-6654-6283-9},
}