High-accuracy distance and inclination measurement using slit-ray projection method

Hiroshi Naruse, Yoshihiko Nomura, Toshio Yamamoto. High-accuracy distance and inclination measurement using slit-ray projection method. Systems and Computers in Japan, 18(12):1-10, 1987. [doi]

Authors

Hiroshi Naruse

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Yoshihiko Nomura

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Toshio Yamamoto

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