Detecting Epileptic Seizures Using Abe Entropy, Line Length and SVM Classifier

Aya Naser, Manal M. Tantawi, Howida A. Shedeed, Mohamed F. Tolba. Detecting Epileptic Seizures Using Abe Entropy, Line Length and SVM Classifier. In Aboul Ella Hassanien, Ahmad Taher Azar, Tarek Gaber, Roheet Bhatnagar, Mohamed F. Tolba, editors, The International Conference on Advanced Machine Learning Technologies and Applications, AMLTA 2019, Cairo, Egypt, 28-30 March, 2919. Volume 921 of Advances in Intelligent Systems and Computing, pages 169-178, Springer, 2019. [doi]

@inproceedings{NaserTST19,
  title = {Detecting Epileptic Seizures Using Abe Entropy, Line Length and SVM Classifier},
  author = {Aya Naser and Manal M. Tantawi and Howida A. Shedeed and Mohamed F. Tolba},
  year = {2019},
  doi = {10.1007/978-3-030-14118-9_17},
  url = {https://doi.org/10.1007/978-3-030-14118-9_17},
  researchr = {https://researchr.org/publication/NaserTST19},
  cites = {0},
  citedby = {0},
  pages = {169-178},
  booktitle = {The International Conference on Advanced Machine Learning Technologies and Applications, AMLTA 2019, Cairo, Egypt, 28-30 March, 2919},
  editor = {Aboul Ella Hassanien and Ahmad Taher Azar and Tarek Gaber and Roheet Bhatnagar and Mohamed F. Tolba},
  volume = {921},
  series = {Advances in Intelligent Systems and Computing},
  publisher = {Springer},
  isbn = {978-3-030-14118-9},
}