Khuram Naveed, Bisma Shaukat, Naveed ur Rehman. Signal denoising based on dual tree complex wavelet transform and goodness of fit test. In 22nd International Conference on Digital Signal Processing, DSP 2017, London, United Kingdom, August 23-25, 2017. pages 1-5, IEEE, 2017. [doi]
@inproceedings{NaveedSR17,
title = {Signal denoising based on dual tree complex wavelet transform and goodness of fit test},
author = {Khuram Naveed and Bisma Shaukat and Naveed ur Rehman},
year = {2017},
doi = {10.1109/ICDSP.2017.8096067},
url = {https://doi.org/10.1109/ICDSP.2017.8096067},
researchr = {https://researchr.org/publication/NaveedSR17},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {22nd International Conference on Digital Signal Processing, DSP 2017, London, United Kingdom, August 23-25, 2017},
publisher = {IEEE},
isbn = {978-1-5386-1895-0},
}