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Methods and Metrics for Reliability Assessment

Lirida Alves de Barros Naviner, Jean-François Naviner, Denis Teixeira Franco, Maí Correia R. de Vasconcelos. Methods and Metrics for Reliability Assessment. In Bernadette Charron-Bost, Shlomi Dolev, Jo C. Ebergen, Ulrich Schmid, editors, Fault-Tolerant Distributed Algorithms on VLSI Chips, 07.09. - 10.09.2008. Volume 08371 of Dagstuhl Seminar Proceedings, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, Germany, 2008. [doi]

Authors

Lirida Alves de Barros Naviner

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Jean-François Naviner

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Denis Teixeira Franco

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Maí Correia R. de Vasconcelos

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