Deepak Ranjan Nayak, Ratnakar Dash, Banshidhar Majhi. Development of pathological brain detection system using Jaya optimized improved extreme learning machine and orthogonal ripplet-II transform. Multimedia Tools Appl., 77(17):22705-22733, 2018. [doi]
@article{NayakDM18a,
title = {Development of pathological brain detection system using Jaya optimized improved extreme learning machine and orthogonal ripplet-II transform},
author = {Deepak Ranjan Nayak and Ratnakar Dash and Banshidhar Majhi},
year = {2018},
doi = {10.1007/s11042-017-5281-x},
url = {https://doi.org/10.1007/s11042-017-5281-x},
researchr = {https://researchr.org/publication/NayakDM18a},
cites = {0},
citedby = {0},
journal = {Multimedia Tools Appl.},
volume = {77},
number = {17},
pages = {22705-22733},
}