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Shree K. Nayar, Simon Baker, Hiroshi Murase. Parametric Feature Detection. In 1996 Conference on Computer Vision and Pattern Recognition (CVPR 96), June 18-20, 1996 San Francisco, CA, USA. pages 471-477, IEEE Computer Society, 1996. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Parametric Feature DetectionSimon Baker, Shree K. Nayar, Hiroshi Murase. ijcv, 27(1):27-50, 1998. [doi]
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