ATM cell error performance of xDSL under impulse noise

Nedko Nedev, Steve McLaughlin, David I. Laurenson, Robert Daley. ATM cell error performance of xDSL under impulse noise. In IEEE International Conference on Communications, ICC 2001, June 11-14, Helsinki, Finland. pages 1254-1258, IEEE, 2001. [doi]

@inproceedings{NedevMLD01,
  title = {ATM cell error performance of xDSL under impulse noise},
  author = {Nedko Nedev and Steve McLaughlin and David I. Laurenson and Robert Daley},
  year = {2001},
  doi = {10.1109/ICC.2001.936893},
  url = {http://dx.doi.org/10.1109/ICC.2001.936893},
  researchr = {https://researchr.org/publication/NedevMLD01},
  cites = {0},
  citedby = {0},
  pages = {1254-1258},
  booktitle = {IEEE International Conference on Communications, ICC 2001, June 11-14, Helsinki, Finland},
  publisher = {IEEE},
  isbn = {0-7803-7097-1},
}