Nanometer Technology Challenges for Test and Test Equipment - researchr publication bibtex

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Wayne M. Needham. Nanometer Technology Challenges for Test and Test Equipment. IEEE Computer, 32(11):52-57, 1999.

@article{Needham99:0,
  title = {Nanometer Technology Challenges for Test and Test Equipment},
  author = {Wayne M. Needham},
  year = {1999},
  tags = {testing},
  researchr = {https://researchr.org/publication/Needham99%3A0},
  cites = {0},
  citedby = {0},
  journal = {IEEE Computer},
  volume = {32},
  number = {11},
  pages = {52-57},
}

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