An improved RF loopback for test time reduction - researchr publication authors

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Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin. An improved RF loopback for test time reduction. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 646-651, European Design and Automation Association, Leuven, Belgium, 2006. [doi]

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