Analytic outlier removal in line fitting

Nathan S. Netanyahu, Isaac Weiss. Analytic outlier removal in line fitting. In 12th IAPR International Conference on Pattern Recognition, Conference B: Patern Recognition and Neural Networks, ICPR 1994, Jerusalem, Israel, 9-13 October, 1994, Volume 2. pages 406-408, IEEE, 1994. [doi]

Authors

Nathan S. Netanyahu

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Isaac Weiss

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