Michael Newey, Gerald R. Benitz, Stephen Kogon. A generalized likelihood ratio test for SAR CCD. In Conference Record of the Forty Sixth Asilomar Conference on Signals, Systems and Computers, ACSCC 2012, Pacific Grove, CA, USA, November 4-7, 2012. pages 1727-1730, IEEE, 2012. [doi]
@inproceedings{NeweyBK12,
title = {A generalized likelihood ratio test for SAR CCD},
author = {Michael Newey and Gerald R. Benitz and Stephen Kogon},
year = {2012},
doi = {10.1109/ACSSC.2012.6489328},
url = {http://dx.doi.org/10.1109/ACSSC.2012.6489328},
researchr = {https://researchr.org/publication/NeweyBK12},
cites = {0},
citedby = {0},
pages = {1727-1730},
booktitle = {Conference Record of the Forty Sixth Asilomar Conference on Signals, Systems and Computers, ACSCC 2012, Pacific Grove, CA, USA, November 4-7, 2012},
publisher = {IEEE},
isbn = {978-1-4673-5050-1},
}