Reference-Free Machine Vision Inspection of semiconductor die Images - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ada N. Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S. M. Fung, W. H. Leung. Reference-Free Machine Vision Inspection of semiconductor die Images. Int. J. Image Graphics, 9(1):133-152, 2009. [doi]

This author has not been identified. Look up 'Ada N. Y. Ng' in GoogleThis author has not been identified. Look up 'Edmund Y. Lam' in GoogleThis author has not been identified. Look up 'Ronald Chung' in GoogleThis author has not been identified. Look up 'Kenneth S. M. Fung' in GoogleThis author has not been identified. Look up 'W. H. Leung' in Google

runs on WebDSL