Motif-based defect detection for patterned fabric

Henry Y. T. Ngan, Grantham K. H. Pang, Nelson Hon Ching Yung. Motif-based defect detection for patterned fabric. Pattern Recognition, 41(6):1878-1894, 2008. [doi]

Authors

Henry Y. T. Ngan

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Grantham K. H. Pang

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Nelson Hon Ching Yung

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