Super-resolution for biometrics: A comprehensive survey

Kien Nguyen, Clinton Fookes, Sridha Sridharan, Massimo Tistarelli, Mark S. Nixon. Super-resolution for biometrics: A comprehensive survey. Pattern Recognition, 78:23-42, 2018. [doi]

Authors

Kien Nguyen

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Clinton Fookes

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Sridha Sridharan

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Massimo Tistarelli

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Mark S. Nixon

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