Michael Nicolaidis, Vladimir Pasca, Lorena Anghel. I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 208, IEEE Computer Society, 2011. [doi]
@inproceedings{NicolaidisPA11,
title = {I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems},
author = {Michael Nicolaidis and Vladimir Pasca and Lorena Anghel},
year = {2011},
doi = {10.1109/ETS.2011.37},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2011.37},
researchr = {https://researchr.org/publication/NicolaidisPA11},
cites = {0},
citedby = {0},
pages = {208},
booktitle = {16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4433-5},
}