Shiqiang Nie, Weiguo Wu, Chi Zhang. Data Pattern Aware Reliability Enhancement Scheme for 3D Solid-State Drives. ACM Trans. Embedded Comput. Syst., 20(5s), 2021. [doi]
@article{NieWZ21,
title = {Data Pattern Aware Reliability Enhancement Scheme for 3D Solid-State Drives},
author = {Shiqiang Nie and Weiguo Wu and Chi Zhang},
year = {2021},
doi = {10.1145/3477000},
url = {https://doi.org/10.1145/3477000},
researchr = {https://researchr.org/publication/NieWZ21},
cites = {0},
citedby = {0},
journal = {ACM Trans. Embedded Comput. Syst.},
volume = {20},
number = {5s},
}