Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk

Rainer Niedermayr, Tobias Röhm, Stefan Wagner 0001. Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk. PeerJ Computer Science, 5, 2019. [doi]

Authors

Rainer Niedermayr

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Tobias Röhm

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Stefan Wagner 0001

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