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Möglichkeiten der Modellierung von Fehlern in MLC-Flash-Speichern durch Fehlergraphen

Günther Nieß, Thomas Kern, Michael Gössel. Möglichkeiten der Modellierung von Fehlern in MLC-Flash-Speichern durch Fehlergraphen. In Douglas W. Cunningham, Petra Hofstedt, Klaus Meer, Ingo Schmitt, editors, 45. Jahrestagung der Gesellschaft für Informatik, Informatik 2015, Informatik, Energie und Umwelt, 28. September - 2. Oktober 2015 in Cottbus, Deutschland. Volume 246 of LNI, pages 1445-1459, GI, 2015.

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Günther Nieß

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Thomas Kern

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Michael Gössel

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