Kaushal Nigam, Vinay Anand Tikkiwal, Mukesh Kumar Bind. Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations. Journal of Circuits, Systems, and Computers, 32(15), October 2023. [doi]
@article{NigamTB23,
title = {Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations},
author = {Kaushal Nigam and Vinay Anand Tikkiwal and Mukesh Kumar Bind},
year = {2023},
month = {October},
doi = {10.1142/S0218126623502523},
url = {https://doi.org/10.1142/S0218126623502523},
researchr = {https://researchr.org/publication/NigamTB23},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {32},
number = {15},
}