D. Nirmal, P. Vijayakumar, Divya Mary Thomas, Binola K. Jebalin, N. Mohankumar. Subthreshold performance of gate engineered FinFET devices and circuit with high-k dielectrics. Microelectronics Reliability, 53(3):499-504, 2013. [doi]
No references recorded for this publication.
No citations of this publication recorded.