Improving Faulty Interaction Localization Using Logistic Regression

Kinari Nishiura, Eun-Hye Choi, Osamu Mizuno. Improving Faulty Interaction Localization Using Logistic Regression. In 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017. pages 138-149, IEEE, 2017. [doi]

@inproceedings{NishiuraCM17,
  title = {Improving Faulty Interaction Localization Using Logistic Regression},
  author = {Kinari Nishiura and Eun-Hye Choi and Osamu Mizuno},
  year = {2017},
  doi = {10.1109/QRS.2017.24},
  url = {https://doi.org/10.1109/QRS.2017.24},
  researchr = {https://researchr.org/publication/NishiuraCM17},
  cites = {0},
  citedby = {0},
  pages = {138-149},
  booktitle = {2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017},
  publisher = {IEEE},
  isbn = {978-1-5386-0592-9},
}